Ellipsometry Data Analysis
A tutorial from J A Woollam on Ellipsometry Data analysis.
Ellipsometry
Book your alpha-SE ellipsometer online demo now!
A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allow
Mueller Matrix Ellipsometry – A Universal Optical Characterisation Technique
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the chan
Ellipsometric Porosimetry Webinar
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2
Feedback from the 19th Annual Woollam Workshop & CompleteEase Course
Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course w
J A Woollam launch the NEW theta-SE Ellipsometer
J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact packag
J A Woollam Software Update: CompleteEase 6
New features for the leading data analysis platform NEW! Push-Button Analysis Tools CompleteEASE has always included pre-built models that enable push-button analysis of transparent films. We’ve
